Abstract
The paper discusses the objectives of spatial point pattern analysis, with particular reference to the distinction between mapped and sampled data. For the former case, available models are reviewed briefly, the role of preliminary testing is discussed and a procedure for fitting a parametric model is outlined. A simulation study of several tests of spatial randomness is intended to provide some insight into the suitability for model-fitting of various summary descriptions of a mapped pattern. Two examples illustrate the use of statistical techniques. Some problem areas which merit further investigation are identified.
| Original language | English |
|---|---|
| Pages (from-to) | 87-101 |
| Number of pages | 15 |
| Journal | Biometrics |
| Volume | 35 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 1979 |
| Externally published | Yes |